Arrive 12:10pm

Plan:
 - Prepare ellipsometer to take measurements of the Au on Black-Au on Au on Si sample.
   - Need to recallibrate ellipsometer; takes about 30 min
   - Take data from Si sample for reference
   - Take data from Mikhail's sample(s)
     - Take data from Jeremy's samples if possible
 - Vent chamber, remove Au on Black-Au on Si sample
   - Fix height of sample holder(s)
   - Install new samples; Si substrate measured by ellipsometer, and one other sample (probably stainless steel)
   - Do TCS for increasing thickness of Au on the samples
   - Then do TCS for increasing thickness of Black-Au
   - Then do TCS for increasing thickness of Au on top
   - Finally, repeat ellipsometric measurements on the samples

- Cooling fan for ellipsometer does not appear to works
  - Had polarity of wires wrong
  - When I swapped them the right way around, the fan spun up and then broke
    - Probably because I had maxed out the voltage on the power supply
  - So now it is actually broken
  - Will need to get a replacement
  - Continue anyway without fan.

- Take Rp and Rs spectrum of control sample (Si wafer)

- Realign gun
  - Resistance of filament 1.8R
- Realign sample holder
  - Check for shorts; everything seems fine

- Take Rp and Rs spectrum of Au+BlackAu+Au on Si sample
- Also take Psi/Del spectrum

- Discovered at some point... the sample fell off the sample mount
  - Not sure exactly when...
  - God dammit
  - Will repeat tomorrow

- Go home at 17:00