4 - Prepare ellipsometer to take measurements of the Au on Black-Au on Au on Si sample.
5 - Need to recallibrate ellipsometer; takes about 30 min
6 - Take data from Si sample for reference
7 - Take data from Mikhail's sample(s)
8 - Take data from Jeremy's samples if possible
9 - Vent chamber, remove Au on Black-Au on Si sample
10 - Fix height of sample holder(s)
11 - Install new samples; Si substrate measured by ellipsometer, and one other sample (probably stainless steel)
12 - Do TCS for increasing thickness of Au on the samples
13 - Then do TCS for increasing thickness of Black-Au
14 - Then do TCS for increasing thickness of Au on top
15 - Finally, repeat ellipsometric measurements on the samples
17 - Cooling fan for ellipsometer does not appear to works
18 - Had polarity of wires wrong
19 - When I swapped them the right way around, the fan spun up and then broke
20 - Probably because I had maxed out the voltage on the power supply
21 - So now it is actually broken
22 - Will need to get a replacement
23 - Continue anyway without fan.
25 - Take Rp and Rs spectrum of control sample (Si wafer)
28 - Resistance of filament 1.8R
29 - Realign sample holder
30 - Check for shorts; everything seems fine
32 - Take Rp and Rs spectrum of Au+BlackAu+Au on Si sample
33 - Also take Psi/Del spectrum
35 - Discovered at some point... the sample fell off the sample mount
36 - Not sure exactly when...
38 - Will repeat tomorrow