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23 \newcommand{\vect}[1]{\boldsymbol{#1}} % Draw a vector
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35 \definecolor{darkgray}{rgb}{0.95,0.95,0.95}
36 \definecolor{darkred}{rgb}{0.75,0,0}
37 \definecolor{darkblue}{rgb}{0,0,0.75}
38 \definecolor{pink}{rgb}{1,0.5,0.5}
39 \lstset{language=Java}
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58 %\title{\bf Characterisation of nanostructured thin films}
59 %\author{Sam Moore\\ School of Physics, University of Western Australia}
63 \section{Ellipsometry}
65 \subsection{Description of Method}
67 Ellipsometry is a versatile optical technique commonly employed for determining the thickness of multilayered thin films \cite{}. In general, ellipsometry measures the parameters $\psi$ and $\Delta$, which are related to the complex Fresnel reflection coefficients $r_s$ and $r_p$:
69 \tan \psi e^{i \Delta} &= \rho = \frac{r_p}{r_s}
74 For a bulk substrate (the simplest possible sample), $r_s$ and $r_p$ may be directly related to the optical constants of the material:
79 \emph{TODO: Multilayered thin films}.
81 \section{Variable Angle Spectroscopic Ellipsometry}
83 Traditional ellipsometers were limited to single measurements at a fixed wavelength and angle; the analysis of thin films involved \cite{}.
89 \subsubsection{Application of Ellipsometry to Multilayered Sample}
92 \bibliographystyle{unsrt}