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+Arrive 12:10pm
+
+Plan:
+ - Prepare ellipsometer to take measurements of the Au on Black-Au on Au on Si sample.
+ - Need to recallibrate ellipsometer; takes about 30 min
+ - Take data from Si sample for reference
+ - Take data from Mikhail's sample(s)
+ - Take data from Jeremy's samples if possible
+ - Vent chamber, remove Au on Black-Au on Si sample
+ - Fix height of sample holder(s)
+ - Install new samples; Si substrate measured by ellipsometer, and one other sample (probably stainless steel)
+ - Do TCS for increasing thickness of Au on the samples
+ - Then do TCS for increasing thickness of Black-Au
+ - Then do TCS for increasing thickness of Au on top
+ - Finally, repeat ellipsometric measurements on the samples
+
+- Cooling fan for ellipsometer does not appear to works
+ - Had polarity of wires wrong
+ - When I swapped them the right way around, the fan spun up and then broke
+ - Probably because I had maxed out the voltage on the power supply
+ - So now it is actually broken
+ - Will need to get a replacement
+ - Continue anyway without fan.
+
+- Take Rp and Rs spectrum of control sample (Si wafer)
+
+- Realign gun
+ - Resistance of filament 1.8R
+- Realign sample holder
+ - Check for shorts; everything seems fine
+
+- Take Rp and Rs spectrum of Au+BlackAu+Au on Si sample
+- Also take Psi/Del spectrum
+
+- Discovered at some point... the sample fell off the sample mount
+ - Not sure exactly when...
+ - God dammit
+ - Will repeat tomorrow
+
+- Go home at 17:00
+
+
+
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